Logic testing and design for testability / Hideo Fujiwara.
Material type:
TextSeries: MIT Press series in computer systemsPublication details: Cambridge, Mass. : MIT Press, c1985.Description: x, 284 p. : ill. ; 24 cmISBN: - 0262060965
- 621.3815/37 19
- TK7868.L6 F85 1985
| Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
Loan - Normal on open shelf
|
UOE Main Library Open shelf | TK7868.L6 F85 1985 (Browse shelf(Opens below)) | 20144751 | Available | 20144751 |
Total holds: 0
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| TK7868.D5 S79 1991 Basic digital electronics / | TK7868 .D5W46 1992 Digital system design | TK7868.I5 J34 1983 Digital electronics practice using intergrated circuits | TK7868.L6 F85 1985 Logic testing and design for testability / | TK7868 .L6 .G52 1986 Electronic Logic Circuits | TK7868.L6 .M355 2002 Introduction to logic design / | TK7868.L6 R67 2006 Fundamentals of logic design / |
Includes index.
Bibliography: p. [272]-278.
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