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Logic testing and design for testability / Hideo Fujiwara.

By: Material type: TextTextSeries: MIT Press series in computer systemsPublication details: Cambridge, Mass. : MIT Press, c1985.Description: x, 284 p. : ill. ; 24 cmISBN:
  • 0262060965
Subject(s): DDC classification:
  • 621.3815/37 19
LOC classification:
  • TK7868.L6 F85 1985
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Holdings
Item type Current library Call number Copy number Status Barcode
Loan - Normal on open shelf Loan - Normal on open shelf UOE Main Library Open shelf TK7868.L6 F85 1985 (Browse shelf(Opens below)) 20144751 Available 20144751
Total holds: 0

Includes index.

Bibliography: p. [272]-278.

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